RecordNumber :
177
Author :
S. Cho and J.-Y. Kim
Title of Article :
Straightness and flatness evaluation using data envelopment analysis
Title Of Journal :
The International Journal of Advanced Manufacturing Technology
Volume :
63
Issue :
42132
Page :
731-740
DOI :
10.1007/s00170-012-3925-6
Year :
2012
Link To Document :
http://library.daneshpajoohan.ac.ir/dL/search/default.aspx?Term=177&Field=0&DTC=4
All Rights Reserved To Payam Mashregh Company
